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- Ph.D., National Chiao Tung University
- Nano device fabrication and characterization
- Device Reliability
Horng-Chih Lin was born in I-Lan, Taiwan, Republic of China on August 1, 1967. He received the B.S. degree in Department of Physics from National Central University, Chung-Li, Taiwan, in 1989, and the Ph.D. degree in Institute of Electronics from National Chiao Tung University (NCTU), Hsinchu, Taiwan, in 1994.
From 1994 to 2004, he was with the National Nano Device Laboratories (NDL), where he has been engaged in the research projects of nano-scale device technology development. He joined the faculty of NCTU in 2004, where he currently an Associate Professor of the Department of Electronics Engineering and the Institute of Electronics. His current research interests include thin-film transistor (TFT) fabrication and characterization, reliability of CMOS devices, and novel SOI device technology. He has authored or co-authored over 100 technical papers in international journals and conferences in the above areas.
Dr. Lin served on the program committee of the International Reliability Physics Symposium (IRPS) in 2001 and 2002. He also served on the program committee of the International Conference on Solid State Devices and Materials (SSDM) in 2005 and 2006. He received the D.-W. Wu award in 2006.
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