Office: Engineering Building IV, Room532
TEL: 886-3-5712121 ext. 54143
- B.S. degree in Electrical Engineering from National Taiwan University in 1980.
- Ph.D. degree in Electrical Engineering from the University of Illinois, Urbana-Champagn in 1985.
- Technical Staff at the High-Speed Devices Laboratory of Hewlett-Packard Labs, from 1985 to 1987.
- Associate Professor at Dept of Electronics Engineering, National Chiao Tung University 1987~1991.
- Professor at Dept of Electronics Engineering, National Chiao Tung University 1991~present.
- Reliability of Semiconductor Devices,
- Flash Memory,
- High-speed Devices and Circuits
Wang, Tahui was born in Taoyuan, Taiwan. He received the B.S. and Ph.D. degrees in electrical engineering from National Taiwan University and the University of Illinois, Urbana-Champagn in 1980 and 1985, respectively.
From 1985 to 1987, he was a Member of Technical Staff at the High-Speed Devices Laboratory of Hewlett-Packard Labs, where he was engaged in the development of high-speed GaAs devices and circuits and circuits. He joined the Department of Electronics Engineering and the Institute of Electronics, National Chiao-Tung University, in 1987 and has been a Professor since 1991. His current research interests include characterization, modeling and physics of hot carrier effects and thin oxide reliability in deep submicron MOSFETs.
Dr. Wang was granted a Best Teaching Award by the Ministry of Education, R.O.C., in 1991. He served as technical committee member of the International Reliability Physics Symposium (IRPS), U.S.A., on the Hot-Carrier/ESD/Latch-Up subcommittee. He has been the IEEE Senior Member since 1994.
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