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Tahui Wang(汪大暉)

Office: Engineering Building IV, Room532
TEL: 886-3-5712121 ext. 54143
FAX: 886-3-5724361
E-mail: twang@cc.nctu.edu.tw

Background

Research

Introduction

        Wang, Tahui was born in Taoyuan, Taiwan. He received the B.S. and Ph.D. degrees in electrical engineering from National Taiwan University and the University of Illinois, Urbana-Champagn in 1980 and 1985, respectively.
        
        From 1985 to 1987, he was a Member of Technical Staff at the High-Speed Devices Laboratory of Hewlett-Packard Labs, where he was engaged in the development of high-speed GaAs devices and circuits and circuits. He joined the Department of Electronics Engineering and the Institute of Electronics, National Chiao-Tung University, in 1987 and has been a Professor since 1991. His current research interests include characterization, modeling and physics of hot carrier effects and thin oxide reliability in deep submicron MOSFETs.
        
        Dr. Wang was granted a Best Teaching Award by the Ministry of Education, R.O.C., in 1991. He served as technical committee member of the International Reliability Physics Symposium (IRPS), U.S.A., on the Hot-Carrier/ESD/Latch-Up subcommittee. He has been the IEEE Senior Member since 1994.
        

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