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Steve S. Chung, Professor(莊紹勳 教授)

Engineering Building 4, Room 501
TEL:(03)573-1830
FAX:(03)573-4608
Email:schung@cc.nctu.edu.tw

Lab room 411: 03-5712121 ext 54224

(mailing address)
Department of Electronics Engineering
National Chiao Tung University
1001 University Road, Hsinchu 300
Taiwan
Tel: 886-3-573 1830 Fax: 886-3-573 4608

Background

Research

Introduction

        Steve S. Chung received his Ph.D. degree from the University of Illinois at Urbana-Champaign, in Electrical Engineering in 1985. His Ph.D.thesis advisor is the world-famous scholar and CMOS Co-Inventor, Prof. C. T. Sah.
        Currently, he is NCTU Chair Professor as well as UMC Research Chair Professor at the National Chiao Tung University (NCTU). Between 2004-2005, he was the first Department Head of EECS Honors Program, to promote a new undergraduate program for academic excellence, at NCTU where he has served since 1987. He was a Research Visiting Scholar with Stanford University, CA, in 2001. He was also the consultant to TSMC on developing CMOS and flash memory technologies. His current research areas include CMOS device technology, flash memory technology, and reliability characterization and modeling; and nanoelectronics in bio applications. He has published more than 140 journal and conference papers, one textbook, and holds more than 18 patents in CMOS and flash memory. He and his Ph. D. student invented the IFCP(Incremental Frequency Charge Pumping) interface characterization method which is a powerful tool for reliability diagnosis of ultra-thin gate oxide CMOS devices with gate oxide thickness down to 1nm [Remark 1]. The merit of this method is its capability for direct tunneling gate oxide CMOS device interface and reliability measurements. It can also be used to replace to conventional CV method that has been used for over 40+ years. Since 1995, he has presented more than 13 times in the prestigious IEEE conferences, IEDM and VLSI, with focus on the reliability and technology of CMOS, flash memory devices.
        He is an IEEE Fellow, an elected AdCom member, Distinguished Lecturer, Regions/Chapters Vice-Chair of EDS, and Editor of EDL. He has served on the committees of premiere conferences, e.g., VLSI Technology, IEDM, IRPS, IPFA etc. For the first time in Taiwan history, at the 50th anniversary of IEEE, ED Taipei chapter was awarded the 2002 EDS Chapter of the Year Award under his leadership as the chapter chair. He was awarded 3 times Outstanding Research Award for excellence in research, as well as the top-PI in 2003, from the National Science Council, Taiwan. He was also granted both Distinguished EE Professor and Engineering Professor by the Engineering Societies of Taiwan.
        
        Major Achievements-
        
        IEEE Fellow
        NSC Research Fellow (2006-2009)
        Distinguished Engineering Professor, Chinese Institute of Engineering 2004
        Distinguished EE Professor, Chinese Inst. Electrical Engineering 2002
        Outstanding Research Award, National Science Council, 1996-2003
        Excellent Research Award, NSC, 1989-1995
        
        patents: 18 (another 2 pending)
        published papers: IEEE Journal and Conference Papers (more than 140)
        
        IEDM/VLSIpapers: presented 13 times as a first author
        1995 VLSI Technology (The first paper contributed from Taiwan)
        1997 VLSI Technology (The only paper contributed from Taiwan)
         [Remark 2]
        1995-2002 VLSI Technology papers : contributed 20% from among Taiwan authors
        
        2002 IEEE EDS Chapter of the Year Award (as a Chapter chair)
        
        IEDMS Best Paper Award (1996)
        
        [Remark 1] S. S. Chung et al., in Symposium on VLSI Tech., pp. 74-75, Hawaii, 2002. (also, US patent, No. 6,746,883)
        [Remark 2] S. S. Chung et al., in Symposium on VLSI Tech., pp. 111-112, Kyoto, 1997.
        
        

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